Thank you and report of "Industrial Camera Exhibition 2022 of OPIE’22"

Descriptions of our booth

Our booth consisted of the following ten sections, each of which is described below;

1. Surface Flaw Detection Scope ^TM (Reference exhibit)
2. RGB+NIR 5.3MP CMOS camera; DU535MCNE (Reference exhibit)
3. CMOS based SWIR camera (Reference exhibit)

Descriptions of each section

1. Surface Flaw Detection Scope ^TM (Reference exhibit)

We showcased an optical solution capable of performing a scratch inspection with a single shot.
A special optical system can display scratches on the surface of plastics in color without post-processing using a PC.

[ Cameras and software used ]

• BU2409MCF
  https://www.toshiba-teli.co.jp/en/products/industrial-camera/usb-camera-bu2409m.htm
• TeliViewer (TeliCamSDK v4.0.1.1)
  https://www.toshiba-teli.co.jp/en/products/industrial-camera/software-telicamsdk.htm

[ Download a document containing exhibition panel image ]

• [ Surface Flaw Detection Scope (in Japanese) ]
  

2. RGB+NIR 5.3MP CMOS camera; DU535MCNE (Reference exhibit)

We demonstrated an RGB+NIR camera DU535MCNE with a 5.33-million-pixel (5.3MP) CMOS image sensor capable of capturing visible and near-infrared (NIR) light simultaneously.

[ Cameras and software used ]

• RGB+NIR camera DU535MCNE (Tentative name)
• Dedicated viewer software

[ Download a document containing exhibition panel image ]

• [ RGB+NIR camera (in Japanese) ]
  

3. CMOS based SWIR camera (Reference exhibit)

We demonstrated a prototype camera equipped with a TriEye CMOS sensor that enables short-wavelength infrared (SWIR) imaging based on CMOS.

[ Cameras and software used ]

• CMOS based SWIR camera (Topics : Notification of collaboration with TriEye)
  https://www.toshiba-teli.co.jp/en/topics/news/2204001.htm
• TeliViewer (TeliCamSDK v4.0.1.1)
  https://www.toshiba-teli.co.jp/en/products/industrial-camera/software-telicamsdk.htm

[ Download a document containing exhibition panel image ]

• [ CMOS based SWIR camera (in Japanese) ]